Extended Defects in Semiconductors : Electronic Properties, Device Effects and Structures

Extended Defects in Semiconductors : Electronic Properties, Device Effects and Structures

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Key Features
  • Format: Paperback
  • Number Of Pages: 644 pages
  • Dimensions: 165.1 x 238.76 x 27.94mm
  • Weight: 1,043.26g
  • Publication date: 07 Aug 2014
  • Publisher: CAMBRIDGE UNIVERSITY PRESS
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The elucidation of the effects of structurally extended defects on electronic properties of materials is especially important in view of the current advances in electronic device development that involve defect control and engineering at the nanometer level. This book surveys the properties, effects, roles and characterization of extended defects in semiconductors. The basic properties of extended defects (dislocations, stacking faults, grain boundaries, and precipitates) are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed. These topics are among the central issues in the investigation and applications of semiconductors and in the operation of semiconductor devices. The authors preface their treatment with an introduction to semiconductor materials and conclude with a chapter on point defect maldistributions. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.

Key Features
  • Format: Paperback
  • Number Of Pages: 644 pages
  • Dimensions: 165.1 x 238.76 x 27.94mm
  • Weight: 1,043.26g
  • Publication date: 07 Aug 2014
  • Publisher: CAMBRIDGE UNIVERSITY PRESS
  • Publication City/Country: Cambridge, United Kingdom
  • Language: English
  • Illustrations note: black & white illustrations
  • ISBN10: 1107424143
  • ISBN13: 9781107424142
Specifications of Extended Defects in Semiconductors : Electronic Properties, Device Effects and Structures
SKU
JU030BKAJ6EYNAFAMZ
Model
9781107424142
Product Dimensions
940x650x110
Author
D Holt
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