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New Approaches To Image Processing Based Failure Analysis Of Nano-Scale ULSI Devices (Micro And Nano Technologies)

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Product details

New Approaches To Image Processing Based Failure Analysis Of Nano-Scale ULSI Devices is an essential academic resource that delves into advanced methodologies for analyzing failures in nano-scale devices, providing insightful perspectives on image processing applications in technology.

Key Features of the Book

Comprehensive Coverage: This book provides an in-depth exploration of image processing techniques specifically tailored for ULSI devices.
Authoritative Contributions: Written by experts in the field, it offers valuable insights and methodologies that are pivotal for researchers and practitioners.
Published by Elsevier: A trusted name in academic publishing, ensuring high-quality content.

Why Choose This Book?

With its focus on image processing and failure analysis, this book is perfect for professionals and students in the fields of technology and engineering, looking to enhance their understanding and application of advanced methodologies in nano-scale devices.

FAQ

Q: Who are the authors?
A: The book is authored by Zeev Zalevsky, Pavel Livshits, and Eran Gur.
Q: What is the ISBN number?
A: The ISBN is 9780323241434.
Q: What is the publication year?
A: The book was published in 2014.

Specifications

Key Features

New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies) ,Ed. :1 By Zeev Zalevsky - Pavel Livshits - Eran Gur - Elsevier Copyright: 2014 ISBN - 9780323241434